Analysis of Chip Circuit Boards
LUMOS FTIR microscope is an ideal instrument for the analysis defects and contaminations in various electronic devices. Besides the visible and chemical characterization of contaminations a wealth of material related information can easily be gathered even on very small and complex samples. Also similar analytical questions like inclusions in polymers and rubbers, defects in mechanical parts and contaminations in pharmaceutical products can be solved quickly without method specific skills.
Application example:
