Atomic Force Microscope designed for easy integration into the Electron Microscopes
The combination of complementary AFM and SEM techniques enables to use the advantages of both commonly used microscopy techniques. The LiteScope™ provides a wide range of Scanning Probe Microscopy (AFM) imaging modes, which can be easily used via replaceable probes.
Main benefits
- Improving the performance of SEM by AFM techniques
- Unique Correlative Probe and Electron Microscopy technology (CPEM)
- Ready for delivery with a new SEM
- Ready as a plug-in for existing microscopes
- Easy integration and mounting / removal in under five minutes
- Easy and fast replacement of probes and samples
- LiteScope™ also works as a stand-alone microscope
- Compatible with FIB, GIS, EDX and other accessories
- Operation of SPM in tilted position (tilt 0° – 60°), min. WD = 5 mm
- The measuring head may be retracted into the body of the LiteScope™ to free up space around the sample
- Comprehensive surface characterization – Topography, Roughness, Magnetic properties, Conductivity, Electrical properties
- Self-sensing probes without optical detection, no laser adjustments
- Commercially-available probes, wide range of measuring modes
- Customer-made probes can be utilized with an appropriate probe holder designed to customer requirements
- User-friendly software
Comprehensive sample analysis including:
- characterization of surface topography
- mechanical properties
- electrical properties
- magnetic properties
